Calculation of Multilayer Thin Film Reflectivity

The multilayer thin film reflectivity calculation program implements a transfer matrix algorithm to model light propagation through stratified media. Key features include: - Matrix multiplication approach for efficient computation of amplitude coefficients at layer interfaces - Support for complex refractive indices and wavelength-dependent material dispersion - Configurable layer parameters (thickness, refractive index) and incidence angles This tool provides accurate reflectance/transmittance calculations for both coherent and incoherent layer stacks, significantly reducing manual computation time in optical coating design and characterization. The algorithm handles arbitrary layer sequences with precision suitable for R&D, manufacturing, and quality control applications. Through its modular architecture, users can extend functionality to incorporate custom material libraries or specialized boundary conditions. The intuitive interface allows rapid parameter sweeps and optimization studies, making it indispensable for thin film engineers and researchers working with anti-reflection coatings, filters, and optical metamaterials.