Enhanced Pseudo-Excitation Method

The Enhanced Pseudo-Excitation Method is an efficient frequency-domain approach for stochastic vibration analysis, particularly suitable for computing dynamic responses of large-scale structures. This technique significantly improves computational efficiency by transforming complex stochastic vibration problems into deterministic analyses through algorithmic decomposition.

Building upon traditional pseudo-excitation methods, the enhanced version employs optimized algorithms and computational workflows to handle multi-point, multi-dimensional random excitations with higher precision. The core methodology involves decomposing the power spectral density matrix of random excitations and constructing corresponding pseudo-excitation systems, thereby converting stochastic vibration response calculations into deterministic solutions for linear systems. In code implementation, this typically involves matrix factorization techniques (e.g., Cholesky decomposition) followed by sequential deterministic response calculations for each pseudo-excitation component.

Engineering applications of this method span three key areas: wind and seismic response evaluation in structural design, spacecraft adaptability analysis under complex random vibration environments, and fatigue life prediction for mechanical systems subjected to random loads. The method's advantages include rapid computation speed, high accuracy, and the capability to handle large-degree-of-freedom systems through efficient parallel processing architectures in implementation.

The Enhanced Pseudo-Excitation Method overcomes computational bottlenecks in traditional stochastic vibration analysis, enabling engineers to accurately assess structural performance under various random environmental conditions during the design phase. This provides a crucial theoretical tool for structural optimization and safety design, where implementation often incorporates frequency-domain response functions and efficient matrix operations to handle large-scale problems.